Electronic properties of uniaxial ferroelectric Sn2P2S6 single crystal are studied by X-ray photoelectron spectroscopy. X-ray photoelectron spectra (XPS) of the valence band (VB) and of the...

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.

2024年12月15日 · XPS可用于定性分析以及半定量分析, 一般从XPS图谱的 峰位和峰形获得样品表面元素成分、化学态和分子结构 等信息，从 峰强可获得样品表面元素含量或浓度（不常用）。 （2）XPS是一种典型的 表面分析手段。其根本原因在于：尽管X射线可穿透样品很深, 但 只有样品近表面一薄层发射出的光电子可逃逸出来。 样品的探测深度（d）由电子的逃逸深度（λ受X射线波长和样品状态等因素影响）决定，通常，取样深度d = 3λ。 对于金属而言λ为0.5-3 nm;无机非 …

2013年6月30日 · A scarcely observed Sn 4d peak in the XPS spectrum of this sample can indicate at the discontinuity of the covering Pd layer. Training of such sample resulted in the appearance of the intensive Sn 4d peak as well as in the appearance of valence states close by the shape to that one in the stoichiometric SnO 2 .

以外来 C1s 谱峰 (284.8 eV) 作为基准进行氧化物荷电校正。 • 采集 XPS 价带谱，以区分 SnO 和 SnO2。 Sn3d 区域具有明显的自旋轨道分裂峰 (Δ 金属 =8.4 eV)。 金属峰的峰形不对称。 观察到锡金属的 3d 3/2 自旋轨道分裂峰的高结合能侧有能量损失特征谱。 SnO 和 SnO 2 的结合能相似。 使用 XPS 价带谱来区分这些氧化物。 根据考古证据，据信人们使用锡的历史至少有5500年，使其成为最早已知的金属之一。 锡在地壳中的含量很小，约0.001%。 锡从矿物锡石中提取而得。 …

To confirm the Sn valence state in the S3 nanosheet, the peak XPS spectra for Sn 0 , Sn 2+ , and Sn 4+ were analyzed and are presented in Figure 3 b. These results indicated no Sn 0 or...

1993年1月1日 · In this work, x-ray photoelectron spectroscopy has been used to obtain comparison spectra of a SnO powder. The SnO powder was generated by grinding ~150 μ m granules of SnO in a mortar and pestle. Grinding is necessary because surface oxidation of the SnO granules occurs producing a SnO 2 shell.

Electronic properties of uniaxial ferroelectric Sn2P2S6 single crystal are studied by X-ray photoelectron spectroscopy. X-ray photoelectron spectra (XPS) of the valence band (VB) and of the...

2020年9月18日 · X射线光电子能谱仪 (X-ray photoelectron spectroscopy) 简称 XPS 是表面分析的有力工具，它提供了元素价态等的信息，其中结合能是判断元素的关键，铄思百检测在这里与大家分享XPS结合能对照表，希望对大家的科研有帮助。

1999年10月1日 · We show that the combined application of Mössbauer spectroscopy and X-ray photoelectron spectroscopy (XPS) provides a consistent picture of the local electronic structure in Tl 5 Te 3, TlTe, Tl 2 Te 3, Tl 4 SnTe 3 and Tl 2 SnTe 5. The results are discussed from a tight-binding calculation of the electronic populations.