2024年7月10日 · I am an ecologist hoping to compare components of microalgae in scanning electron microscopy (SEM) images. I was originally going to use something like the photoQuad image analysis program to produce a spatially stratified random field of 100 points to calculate percent cover of the components of the microalgae and compare between samples.

Despite advances in other types of light (LM), atomic force microscopy (AFM), and electron microscopy (EM), scanning electron microscopy (SEM) remains distinct in its ability to examine dimensional topography and distribution of exposed features.

This ebook will cover key considerations when approaching an SEM experiment. A typical SEM experiment will require several decisions, including selecting the instrument and the detector(s) and making changes to refine the measurement. This ebook will help you gain great insights into SEM and feel confident in your future SEM experimental design.

2023年4月21日 · Scanning electron microscopy (SEM) is one of the most popular and widely used techniques for the characterization of nanomaterials and nanostructures. With a magnification range of 10 to over 300,000, SEM can properly analyze specimens down to a resolution of a few nanometers.

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on!

2023年10月18日 · In cases where polymer mixtures are comprised of substances that blend well together, SEM reveals substantial phase homogeneity. Conversely, when immiscible polymers are mixed, SEM uncovers a heterophasic morphology with variable interfacial adhesion, dependent on the presence and concentration of compatibilizer additives.

2018年9月19日 · Scanning electron microscopy (SEM) is an important electron microscopy technique that is capable of achieving a detailed visual image of a particle with high-quality and spatial resolution. SEM is a multipurpose state-of-the-art instrument which is largely employed to observe the surface phenomena of the materials.

SEM analysis provides detailed, high resolution imaging capabilities at a very wide range of magnifications from 10x to 1Mx magnification on a diverse and large group of sample types. This flexibility, as well as the dynamic, high depth of field images obtained with this analysis makes it a go-to method to gain structural insight on wide range ...

While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic ...

While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic ...