Thermo Scientific floor model scanning electron microscopes offer the flexibility and versatility to meet a wide range of academic and industrial needs: support for large and heavy samples, a wide range of accessories, excellent imaging quality for the most challenging materials or the smallest details, and dynamic experimentation.

Apreo 2 is the only SEM that offers high-resolution performance (1nm) and excellent image quality at analytical working distance (10mm). Sample morphology, topography and surface information can all be simultaneously explored while being at a safe distance from the pole piece.

SEM image in real time according to elemental composition using combined SEM and EDS imaging. The navigation function, integrated in the SEM user interface, saves time with the capability to load more than 18 samples at a time and navigate directly to the region of interest thanks to the integrated navigation camera. Axia ChemiSEM. Prisma E SEM.

Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. The new Thermo Scientific Helios 5 DualBeam builds on the high-performance imaging and analysis capabilities of the industry-leading Helios DualBeam family.

sem扫描电镜具有高度的灵活性和丰富的功能，包括多种检测器、附件，可以满足广泛的研究和工业需求。 无论样品尺寸、重量、导电性如何，扫描电镜都可以让您轻松应对挑战，获得出色的SEM图像和SEM分析结果。

全新的 Thermo Scientific Apreo 2 SEM 可进行高分辨率成像，并且可以扩展至材料的元素分析。 凭借独特的实时元素成像功能，即 Thermo Scientific ColorSEM 技术，可以通过最直观的界面实时获取元素组分信息。 ColorSEM 技术消除了与典型 EDS联用的所有复杂操作，为您提供前所未有的快捷和易用性。 凭借 Thermo Scientific SmartAlign 技术（软件自动光学对中），Apreo 2 SEM 对用户和实验室管理人员的要求非常低。

Thermo ScientificTM PhenomTM ParticleX 是一款多功能台式 扫描电镜 解决方案,旨在在微观尺度上进行质量控制和清洁度分析,能够快速进行材料分析、验证和分类,并快速提供准确和可靠的数据。 该系统可自动化运行,一次可分析多个样品,测试和分类速度可达其他方法的 10 倍。 ParticleX 软件用户界面。 启动自动特征分析运行即可自动分析行业标准的 47 毫米滤纸。 系统配置标准分析菜单,同时菜单中颗粒粒度范围、化学分类规则、感兴趣区域和运行停止标准等参数可自定义,以 …

DualBeam仪器系列包括多款FIB-SEM聚焦离子束扫描电子显微镜（双束电镜）产品，适用于自动结构分析、TEM 样品制备以及纳米原型设计。 学术界和工业界的科学家和工程师不断面临着需要对各种样品和材料进行高度局部表征的新挑战。 提高这些材料质量的持续动力意味着常常需要纳米级的结构和组分信息。 DualBeam 聚焦离子束扫描电子显微镜 (FIB-SEM) 仪器通过将 FIB 的精确样品修饰与 SEM 的高分辨率成像相结合，正好完全这类数据。 赛默飞世尔科技是 FIB-SEM …

The Verios 5 XHR SEM offers sub-nanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast. Unprecedented levels of automation and ease-of-use make this performance accessible to users of any experience level.

Quattro SEM supports scanning presets, column presets, easy camera-based navigation, SmartSCAN ™ and drift compensated frame integration (DCFI) to boost productivity, data quality and ease of use even further. Additional software extensions can be added to Quattro SEM to enable large area mapping and correlation to other techniques