
In situ XPS analysis of the electronic structure of silicon and ...
2021年3月15日 · In this study, we focus on reducing the amount of carbon from UHV chamber inside surfaces via silicon and titanium coatings using a low-pressure inductively-coupled downstream plasma source and we characterize the surface alterations by in situ X-ray photoemission spectroscopy (XPS).
O 1s (a) and Si 2p (b) XPS spectra for colloidal silica with and ...
Conclusively, the presence of lattice defects in all the synthesized samples has been confirmed using XPS that can play a prominent role in the photocatalytic performance of the materials. ... ...
XPS中O1s分峰问题求助!!! - 催化 - 小木虫 - 学术 科研 互动社区
o1s的xps峰一般会分成两个,表面氧和晶格氧,表面氧并不是所说的氧杂质,而是表面的羟基、水啊、氧空位啊什么的,具体的文献都有解释,mgso4中的氧应该对应于晶格氧,而mg(oh)2.2h2o应该对应于表面氧,至于三种氧峰对应于复盐中的三种氧似乎并不是太可取 ...
(a,b) C1s and O 1s XPS spectra for unmodified substrate and (c …
XPS spectrum of unmodified sub- strate showed the presence peaks corresponding to C 1s and O 1s (Fig. S10a). Surface modified film also displayed peaks corresponding to C 1s and O 1s....
XPS and FT-IR investigation of silicate polymers
2009年4月1日 · Initial investigations of the development of the inorganic polymer as a function of time using XPS analysis showed that the O1s peaks were broadened and shifted to higher binding energies, indicating that the amounts of Si–OH and Si–OK were increased in the reaction, which is consistent with the dissolution model.
Figure 2. XPS core level spectra of (a) C1s, (b) O1s, and (c) Si2p in...
... deconvolution of O1s peaks confirms the existence of C-Si-O/Si-C-O bonds, which were generated during the anodic oxidation process. However, the penetration depth for XPS detection is...
使用 XPS 解析硅酸盐玻璃 O 1s 光谱的桥接氧信号:对 O 和 Si 形 …
出色的分辨率揭示了所研究的 PbO-SiO2 玻璃中的两个 O 1s 峰。 一个清晰解析的高结合能 O 1s 峰代表桥接氧信号,第二个较低能量的峰代表非桥接氧和金属桥接氧的贡献。 这些数据允许在没有详细解卷积的情况下对桥接氧含量进行量化,因为峰宽和强度都完全由光谱数据决定。 桥接氧信号的强度随着 SiO2 含量的降低而系统地降低;然而,如果假设玻璃中的所有 Pb 原子都与两个非桥接氧原子(即 O-Pb-O 单元)相关联,则测量的桥接氧丰度比预测的要大。 例如,在原硅酸 …
High resolution O 1s XPS spectral, NMR, and thermodynamic …
Recent technical advances in X-ray photoelectron spectroscopy (XPS) have largely overcome differential charging of insulator surfaces, with the result that O 1s linewidths for silicates can be routinely collected that are 50% to 100% narrower than had been previously obtainable.
Resolution of bridging oxygen signals from O 1s spectra of …
2007年9月1日 · We used an advanced charge compensation system on an X-ray Photoelectron Spectrometer to yield linewidths from O 1s, Si 2p and Pb 4f spectra of 1.22, 1.35, and 1.10 eV, respectively. These linewidths (eV) are the narrowest obtained for silicate glasses, on any X-ray Photoelectron Spectrometer, to date.
On the wrong assignment of the XPS O1s signal at 531
2021年10月1日 · Metal oxides exposed to water give rise to XPS O1s signal at 532.5–533.0 eV for the irreversibly adsorbed molecular mode as well as, in most cases, to dissociatively adsorbed water molecules at ca. 531.5 eV or close; surface hydroxyls. The following three examples of in situ studies illustrate the process.
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