2021年6月1日 · Scanning near-field optical microscopy (SNOM) allows us to beat the diffraction limit and bring the diagnostic power of the IR to the nanoscale. Recently SNOM has...

snom 成像技术应用于研究微纳尺度上光与原子、分子、二维材料、生物大分子、非线性结构等物质相互作用的时空细 节，并阐述了所揭示的微纳尺度上光和物质相互作用的深层次物理、化学和生物学一系列新现象和新规律。

互补的afm-ir和散射snom图像首次揭示了光学奇性在表面结构上的微尺度起源。 通过访问关于质的结构的辐射 （s-SNOM） 和非辐射 （AFM-IR） 信息，可以获得独特且互补的质质属性。

2025年2月1日 · s-SNOM is based on AFM and uses a near-field infrared signal, so it can simultaneously provide surface morphology and optical information. As an advanced analytic tool, s-SNOM can be used in various thin films, such as 2D materials, oxide, and polymers.

(i) s-SNOM: scattering-type scanning near-field optical microscopy, and (ii) AFM-IR: atomic force infrared microscopy (also referred to as PTE, PTIR, PiFM & PiF-IR) Both approaches are scanning probe techniques that combine AFM with IR …

2021年11月30日 · Two fundamentally different scanning probe IR nanospectroscopy techniques, namely, scattering-type scanning near-field optical microscopy (s-SNOM) and atomic force microscopy-infrared spectroscopy (AFM-IR), provide the capabilities for mapping the reactivity pattern of catalytic surfaces with a spatial resolution of ∼20 nm.

This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM). The presenter – Bruker expert Cassandra Phillips, Ph.D. – differentiates AFM-IR and s-SNOM by comparing them to more familiar techniques:

2005年9月29日 · Scanning near-field optical microscopy (SNOM or NSOM) is the technique with the highest lateral optical resolution available today, while infrared (IR) spectroscopy has a high chemical specificity. Combining SNOM with a tunable IR source produces a unique tool, IR-SNOM, capable of imaging distributions of chemical species with a 100 nm spatial ...

The s-SNOM technique works on a variety of materials, but the best signal to noise tends to be on harder materials with high reflectivity, high dielectric constants, and/or strong optical resonances. Bruker's nanoIR3-s provides an ideal platform for s-SNOM capabilities, eliminating the need for complex optical alignments:

扫描近场光学显微镜(scanning near-field optical microscopy, SNOM)，能在纳米尺度上探测样品的光学信息，打破了长久以来经典(或远场)光学显微镜理论分辨率的 阿贝衍射极限 ，将光学分辨率提高了几十甚至上百倍。且纵向分辨率优于横向分辨率，能够得到清晰的三维 ...