2018年1月8日 · The X-ray diffraction (XRD) measurement shows the structure properties of SnSe under various pressure conditions of SnSe, 25 and the XRD pattern of this experiment shows that three new diffraction peaks at about 13.71°, 14.31°, and 24.21° suddenly emerge with pressure gradually increasing to 12.1 GPa, where the phase I–II structural ...

We report p-type tin monoselenide (SnSe) single crystals, grown in double-sealed quartz ampoules using a modified Bridgman technique at 920 °C. X-ray powder diffraction (XRD) and energy...

Powder X-ray diffraction (XRD) patterns recorded for the synthesized SnSe powder confirm the formation of nanocrystalline SnSe (Fig. 1). The peaks were compared with JCPDS data (JCPDS Card...

2021年3月1日 · The lattice structures of as-prepared samples were characterized by X-ray diffraction (XRD). The XRD patterns of SnSe, mixed SnSe and SnSe 2, and SnSe 2 films on SiO 2 substrates are shown in Fig. 2 (d), respectively.

2024年6月1日 · The X-ray diffraction (XRD) peak broadening analysis was employed to investigate particle size and intrinsic strain in the synthesized SnSe nanoparticles. The Williamson–Hall (W-H) method, Size–Strain Plot (SSP), and Halder–Wagner Method (H-W) were specifically utilized for this purpose.

X-ray diffraction (XRD) was used to identify its structure, which revealed an orthorhombic structure. Raman spectroscopy revealed vibrational modes, whereas UV-Vis spectroscopy revealed an...

2022年11月18日 · The crystalline structure of as-grown SnSe 2 /SnSe is probed by X-ray diffraction (XRD). As shown in Figure 2f, the diffraction peaks are ascribed to SnSe 2 and SnSe, respectively, reconfirming the formation of SnSe 2 /SnSe heterostructures.

2020年1月1日 · The study of the selenization temperature and substrate type influence on the microstructure and morphology of the resulting tin selenide thin films is performed by XRD, EDAX, SEM and AFM. The optical properties of the SnSe films deposited onto glass and silicon substrates were obtained.

2025年2月3日 · 报道了使用环保型高能球磨机 （HEBM） 和熔融技术合成和结构表征斜方晶系硒化锡 （SnSe） 纳米颗粒。样品分别通过 HEBM 合成 18 h 和 22 h，同时在 920 °C 下合成熔融样品，然后在 600 °C 下退火 24 h 和 530 °C 退火 26 h。在 920 °C 下合成另一个熔融样品，然后在 600 °C 下退火 23 小时。X 射线衍射 （XRD ...

2019年11月9日 · Samples’ phase purity and textured structures were studied using X-ray diffraction (XRD, RINT 2000, Rigaku, Japan) with Cu K α radiation. X-ray pole figures were measured to study the crystal direction distribution using a Bragg-Brentano focusing with 2 mm Schulz slit and 0.67° divergence slit, 1.3 mm anti-scatter slit, and 0.6 mm receiving ...