
Study of dry and electrogenerated Ta2O5 and Ta/Ta2O5/Pt structures by XPS
1998年8月14日 · Two kinds of tantalum oxide films have been studied by XPS: dry and electrogenerated anodic oxides. XPS spectra of Ta4f and O1s have been used to determine …
X-ray photoelectron spectroscopy of thermal thin Ta2O5 films …
1998年9月1日 · XPS analysis (including peak decomposition technique) shows that the layers obtained by thermal oxidation of tantalum films on Si at temperatures 673 and 773 K are …
Tantalum Spectra – Ta2O5 – The International XPS Database 1
XPS Spectra Tantalum (Ta) Compounds The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key …
Optical Properties and Elemental Composition of Ta2O5 Thin …
The elemental composition and chemical bonding state in the as-deposited thin film has also been probed by X-ray photoelectron spectroscopy (XPS). The XPS results reveal that the main …
X-ray Photoelectron Spectroscopy (XPS) Reference Pages
X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of …
天然氧化物/Ta 界面处低价氧化物分布的 XPS 深度剖面,Journal of …
通过观察核心能级光谱、价带光谱和功函数变化,对多晶 ta 样品上自然形成的天然氧化物的 x 射线光电子能谱 (xps) 深度剖面研究进行了探测。 本论文解决了沿氧化物层深度存在不同 Ta 低氧 …
a XPS survey spectra of Ta2O5, ammonolysed Ta2O5 and Cu-doped Ta2O5 ...
Ta2O5 is an important material that recently has been discovered to serve as an attractive alternative to TiO2 during photocatalytic and photoelectrochemical processing given that the …
XPS spectra of (a) Ta 4f, (b) Ta 4d, and (c) O 1s regions of a Ta2O5 ...
Novel tantalum (Ta) and chitosan (CS)-doped CuO nanorods (NRs) were synthesized using a single step co-precipitation route. Different concentrations (2 and 4%) of Ta were used in fixed …
An XPS depth-profile study on electrochemically deposited TaO x
2013年8月22日 · The electrochemically induced nonhydrolytic condensation route is proposed to be capable of producing TaO x with a distribution gradient of Ta2O5, TaO2, and TaO in the …
X-ray photoelectron spectroscopy of thermal thin Ta2O5 films …
1998年9月1日 · The effect of nitrogen annealing at 1123 K for 30 min on the structural characteristics of thin (15 nm) thermal Ta 2 O 5 layers on Si was examined by X-ray …
- 某些结果已被删除