"NEOARM" supports enhanced contrast of light elements by a newly-designed ABF imaging technique (e-ABF：enhanced ABF). This capability facilitates atomic-level structure observation of materials containing light elements.

"NEOARM"は、当社独自の技術で開発された冷陰極電界放出形電子銃（Cold-FEG）と高次の収差まで補正可能な新型球面収差補正装置（ASCOR）を標準搭載し、200 kVの高加速電圧だけでなく30 kVの低加速電圧においても原子分解能での観察を実現しました。

The NEOARM excels at atomic-resolution imaging for a wide range of accelerating voltages ranging from 30 kV to 200 kV. The NEOARM features a unique cold field emission gun (Cold-FEG) as well as a next generation advanced Cs corrector (ASCOR) that compensates for higher order aberrations.

The NEOARM has a cold FEG emitter with an energy resolution of 0.31 eV. In TEM mode the point-to-point resolution is the same as our 2010F instrument of 0.19 nm. The NEOARM will be calibrated in STEM aberration corrected mode to operate at 200 kV, 80 kV and 40 kV, providing exceptional versatility for imaging a wide range of different materials ...

2025年3月20日 · The Jeol NEOARM 200 Aberration Corrected TEM/STEM system includes a field emission gun, energy dispersive X-ray (EDS) and electron energy loss (EELS) spectrometers, 4D STEM camera, IDES Relativity, Synchrony and Luminary systems and several fast and high-resolution cameras for acquisition of images and data.

The NCF users have access to a state-of-the-art aberration-corrected Transmission Electron Microscope JEOL NEOARM 200CF that is capable of TEM and STEM imaging at exceptionally high resolution, including single atom imaging. The ultrahigh resolution (UHR) pole piece provides single-atom imaging capabilities in STEM mode with a resolution of 71 pm.

“NEOARM”支持能增强轻元素衬度的新ABF成像技术（e-ABF：enhanced ABF），实现了对含有轻元素样品的原子级结构的观察。 STEM系统标配的Perfect sight检测器作为混合检测器，采用了由不同材料制成的闪烁器。

"NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.

“neoarm” 标配了日本电子独自开发的冷场发射电子枪（cold-feg）和全新的高阶球差校正器（ascor）。 无论是在200kV的高加速电压还是在30kV的低加速电压下，均能实现原子级分辨率的观察与分析。

日本电子透射电镜TEM, “NEOARM” 标配了日本电子独自开发的冷场发射电子枪（Cold-FEG）和全新的高阶球差校正器（ASCOR）。 无论是... 除厂家/中国总经销商外，我们找不到 JEM-ARM200F NEOARM 原子级分辨率透射电子显微镜 的一般经销商信息，有可能该产品在中国没有其它经销商。 JEM-ARM200F NEOARM 原子级分辨率透射电子显微镜 信息由日本电子株式会社 (JEOL)为您提供，如您想了解更多关于 JEM-ARM200F NEOARM 原子级分辨率透射电子显微镜 报价、 …