2012年4月1日 · X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used to analyse the α-Ti phase in both as-sintered and as-cast α-Ti materials. The structure factor of the (0001) plane of the α-Ti phase is 0.

2018年8月1日 · Phase transformation process of interfacial Ti precipitates in Nb-Ti-Si based alloys is systematically investigated by in-situ transmission electron microscopy (TEM) observation. The Ti precipitates exhibit an uncommon face-centered cubic (fcc) structure, which can be identified by analyzing its chemical composition and phase transformation ...

2018年8月24日 · The objective of this study is to seek fundamental insight into the oxidation behavior of a Ti2AlNb-based alloy via detailed microstructural characterization of oxide scale and scale/substrate ...

2012年4月1日 · hcp 结构的 alpha-Ti 是两种基本相（alpha-Ti 和 beta-Ti）材料之一。 X 射线衍射 (XRD) 和透射电子显微镜 (TEM) 用于分析烧结态和铸态 α-Ti 材料中的 α-Ti 相。 α-Ti 相的 (0001) 面的结构因子为 0。

2024年9月24日 · Here, by using in situ transmission electron microscopy (TEM), we uncover direct evidences on the nucleation and growth of FCC-Ti right in front of the crack tip in the α-Ti matrix. Atomic resolution images further reveal that the transformation can be mediated by either partial dislocations on basal planes or shear and atomic shuffle on the ...

Download scientific diagram | (a) Bright field transmission electron microscopy (TEM) image showing the ultrafine α + β microstructure formed at the center of a Ti-64 SLM sample (see z ~ 5 mm...

HREM TEM simulations are needed to interpret the contrast mechanisms and complicated Interference Patterns of HRTEM IMAGES. Through careful experimentation, image acquisition and simulation of HRTEM images, we can reconstruct the projected potential of the specimen and determine its atomic structure.

2018年2月6日 · Metastable β-Ti partially transforms into an intragranular amorphous phase due to local lattice shear and distortion. The lenticular amorphous plates, which very much resemble α′/α″ martensite in...

2012年4月1日 · X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used to analyse the α-Ti phase in both as-sintered and as-cast α-Ti materials. The structure factor of the (0001) plane of the α-Ti phase is 0.

2022年8月28日 · Transmission electron microscopy (TEM) is a form of microscopy which in which a beam of electrons transmits through an extremely thin specimen, and then interacts with the specimen when passing through it. The formation of images in a TEM can be explained by an optical electron beam diagram in Figure 8.2.1 8.2. 1.