It was observed the growth a novel type of nanostructured V 2 O 5 thin films using as deposition technique spray deposition at low temperature (250°C) followed by thermal annealing in …

2001年9月28日 · In the work presented in this paper, we have used in situ deposition and ultrahigh vacuum scanning probe microscopy (UHV-SPM), which includes UHV scanning …

AFM results ( Figure 5) indicated that the deposited V2O5−x of 5 nm thickness produced isolated islands. Before obtaining the AFM results, we actually expected that the surface coverage of...

Download scientific diagram | (a), (b) Illustrative and AFM images for the sample of (a) V2O5 network and (b) residual structure after the removal of the V2O5 nanowires. These AFM …

After calcining the film at 300 °C (30 min), it was found that it oxidized to V2O5, with SEM and atomic force microscopy (AFM) results showing that the film structure retained the hierarchic ...

2019年5月29日 · The SEM and AFM images evidenced that the W-doped films change nanostructured form from nanorods to composition of nanorods and nanoplates at 400 °C, …

2008年6月1日 · One of the first in situ AFM imaging of the surface films formation on V 2 O 5 cathodes (prepared by thermal evaporation), cycled in LiPF 6 (EC:DMC 1/1) in the reversible …

Among the transition metal oxides, vanadium pentoxide V2O5 is a promising candidate as positive electrode material for lithium secondary microbatteries. Indeed, this material presents …

2001年8月20日 · The detailed structure of V 2 O 5−X –Pa fibres was searched using the atomic force microscope (AFM) in tapping mode, Fig. 1, and the results show a measured width of …

高分辨透射（hrtem）和原子力显微镜（afm）表征证明该类石墨烯氧化钒大约为3个原子层厚度。 要点二：类石墨烯氧化钒材料表现出超过700 mAh g-1的超高容量。