In this study we prepared a WO3-based catalyst to investigate its catalytic activity in the total oxidation of the volatile organic compounds known as benzene, toluene and xylene (BTX). For a...

The as-prepared WO3@BLP was characterized using Fourier transform infrared spectroscopy (FT-IR), X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), transmission ...

2020年7月18日 · Microstructure of as-prepared WO 3 thin films was characterized using X-ray diffraction (XRD), scanning electron microscope (SEM), and Fourier transform infrared (FTIR) spectroscopy.

Pairing graphene and its derivatives with tungsten oxide (WO3) to create heterojunction could be an auspicious tool to improve photocatalysis, energy storage, medical, electrochromism, and energy...

2020年1月1日 · In this work, photoatalysts with tunable hexagonal/monoclinic WO 3 phase junction (h/m-WO 3) were prepared by presice controlling the h-WO 3 → m-WO 3 phase transformation. Based on in-situ XRD results, a suitable calcination temperature (400 °C) was selected to realize the phase transition from h-WO 3 to m-WO 3.

2014年11月1日 · X-ray diffraction (XRD) patterns were obtained by a Bruker, AXS D8 Advance diffractometer operated at 40 kV, 40 mA at 2θ (Cu Kα) = 10–60°, step = 0.01° and scan speed = 0.05°/s. The crystal size (d XRD) was determined using the Rietveld fundamental parameter method with the structural parameters of WO 3 [30].

2016年12月30日 · The X-ray diffraction (XRD) analysis was carried out using a Panalytical X’Pert Pro Cu Kα radiation source (λ Cu = 0.15405 nm) in the θ–2θ geometry. Thicknesses of the films were determined by small angle X-ray reflectivity.

Structural investigations on WO3·nH2O using X-ray diffraction and Fourier–transform infrared spectroscopy confirm that the quantity of hydrate groups increases due to the interaction between H+...

2015年12月2日 · 如图所示为WO3 粉体和不同衬底WO3薄膜的XRD谱。 由图可以看出，以石英玻璃和石墨片为衬底制得的薄膜，除了衬底的特征峰外，可以观察到在2θ为23.07°、23.61°和24.32°的位置具有WO3的衍射峰，对应单斜晶型WO3 (JCPDS Card 83—0951)的 (002)、 (020)和 (200)晶面。 值得注意的是，该薄膜具有很明显的 (002)、 (020)和 (200)晶面择优生长取向，这可能是与镀膜衬底有关，SANTATO等的研究也有相类似的发现。

X-ray diffraction (XRD) patterns were obtained by a Bruker, AXS D8 Advance diffractometer operated at 40 kV, 40 mA at 2u (Cu Ka) = 10–60 , step = 0.01 and scan speed = 0.05 /s. The crystal size (dXRD) was determined using the Rietveld fundamental parameter method with the structural parameters of WO3 [30].