We observed that XPS spectra of La did not show any signature of metallic or reduced bonding signal as the two peaks corresponding to La 3d 3/2 and 3d 5/2 were found to be located at $834.4 and...

2021年2月15日 · XPS analysis was employed to study the oxidation states of the constituent elements of Lu modified CNTs/ZnO sample as shown in Fig. 4 (a). Zn 2p spectra (Fig. 4 (b)) consisted of two peaks at 1021.6 eV and 1045.0 eV, which correspond to Zn2p 3/2 and Zn2p 1/2, respectively and had proven the presence of Zn in divalent state [19].

A small chemical shift in Lu 4d for Lu 2 O 3 was observed in both as-deposited and annealed Lu 2 O 3 thin film after 10 min. of Ar + ion sputtering. XPS studies show presence of oxide defects in surface layers and the inner layers of Lu 2 O 3 thin films.

1987年8月1日 · The Lu(4d) and Lu(4f) levels could be fitted with only one doublet at 197.1 and 8.5 eV respectively (table 2), which similarly must be ascribed to Lu(III) ions surrounded by OH-, C02 - or C204 - anions. A quantitative evaluation of sample composition based on XPS peak intensities gave a fairly good concordance with the TG analysis of these samples.

2022年8月15日 · The predominant peak of B 0.2 LN: Dy 3+ sample (Lu 4d5 197.16 eV) shifts to lower energy compared with BLN: Dy 3+ (Lu 4d5 198.32 eV) and LN: Dy 3+ (Lu 4d5 197.47 eV), respectively. To study the changes of the chemical microenvironment from emitting centers of Dy 3+ ions, the high resolution XPS spectra of Dy(4d) are also measured, as depicted ...

In this article, we report the property evaluation of Lu doped TiO2 thin films suitable for catalytic activity. The detailed investigation on the film's structural, optical, and chemical...

Collect principal Lu (4f) peak as well as Lu (4d). Long time exposures (high dose) to X-rays can degrade various polymers, catalysts, high oxidation state compounds; During XPS analysis, water or solvents can be lost due to high vacuum or irradiation with X-rays or Electron flood gun

The X-ray fluorescence analysis method was used to measure the concentrations of Lu and Gd elements in LuGdVO4. The XRD result indicated that LuGdVO3 was the orthorhombic structure with space ...

镥元素 XPS 主峰：Lu4d 干扰峰：不适用 常见化学状态的结合能：不适用. 实验信息. 不适用. XPS 光谱解读. 不适用. 关于本元素. 符号：Lu 发现时间：1907年 命名起源：命名起源 Lutetia 外观：银白色 发现人：Georges Urbain 来源于：硅铍钇矿、磷钇矿. 熔点：1656 K 沸点 ...

A shift of 0.1 eV in O 1s core level for oxide defects and 0.2 eV in Lu 4d for Lu 2 O 3 were observed after 10 min. of Ar + ion sputtering. The XPS survey spectrum of annealed Lu 2 O 3 thin film is showed in Figure 3(a). The peaks arising from Lu 4d, 4f, 4p, 5p, C 1s and O 1s are clearly seen in the spectrum. High resolution spectra of Lu 4d ...