Raman spectra measurements were carried out on a HORIBA Raman spectrometer with a 488 nm argon ion laser. The X-ray diffraction (XRD) pattern was recorded using a RigakuSmartLab X-ray...

2019年5月29日 · Here we developed a two-step chemical vapor deposition (CVD) method to synthesize large-area PtSe 2 films with high crystallinity on diverse substrates, such as silicon, quartz, and sapphire.

2024年10月21日 · In summary, detailed Raman analysis and XRD measurements confirm the high-quality growth of PtSe 2 by our newly developed MOCVD approach. In addition, XPS measurements support the conclusions drawn from Raman and XRD analysis.

4 天之前 · [53, 75] Notably, prolonged treatment (600s) results in reduction of the diffraction peak at 32.9° and the emergence of a new peak at 47.3°, which corresponds to Pt (200) facet, suggesting the formation of elemental platinum on the PtSe 2 surface. The XRD results (Figure 2d) suggest that the main effect of plasma treatment is the exposure of ...

Scanning transmission electron microscopy (STEM) images (measured by Thermo Scientific Spectra 300) and X-ray diffraction (XRD) patterns (obtained by Smartlab9KW) are employed to elucidate atomic structure and crystal quality of the prepared layered PtSe 2.

2018年8月27日 · XRD patterns of the synthesized PtSe 2 film, absorption spectrum of CdTe, electrical contacts and photoresponse of CdTe and PtSe 2, response speed of PtSe 2 /CdTe heterojunction PD at 1 kHz, and stability of PtSe 2 /CdTe heterojunction PD .

2023年11月21日 · Large-area 2D PtSe 2 layers enable the in situ fabrication of highly integrated device arrays based on PtSe 2 /AlO x /Ge Schottky junctions, demonstrating an admirable MIR imaging capability at room temperature. Our study presents a novel approach for the fabrication of novel uncooled broadband IR photodetectors.

2020年6月1日 · Particularly for PtS 2, the deviation can be explained by XRD measurements as 2–4% of PtS is detected (Fig. 3), resulting in a lower chalcogen-metal ratio. At the same time, XRD disclose high preferential orientation and purity for both PtSe 2 and PtTe 2. They exist as few layers in a well-ordered stacking structure based on their conspicuous ...

The X-Ray diffraction (XRD) patterns showed the diffraction peaks characteristic for PtSe2 with improving crystallinity when increasing the Pt deposition time.

We determine the sheet conductance and absorption coefficient of few-layer PtSe2 in the infrared and UV–vis ranges without recourse to any particular model for the optical constants. PtSe2 samples...