2020年6月10日 · The structural characterization was performed with X-ray diffraction (XRD) measurements of the dried powder samples using a PANalytical Empyrean equipment, with a copper tube (λ = 1.5418 Å), Ni...

SnO prepared by soft chemistry exhibits a black color and semiconducting properties. The X-ray diffraction indicates a tetragonal symmetry (SG: P4/nmm) with nano crystallites of average size of...

2022年5月5日 · The bonding structure of tin oxide (SnO x) films grown by reactive DC magnetron sputtering has been studied by the combination of X-ray diffraction (XRD) and soft X-ray absorption near-edge structure (XANES). The oxygen incorporation in the films has been controlled by the O2 partial pressure (PO2) in the O 2 /Ar discharge mixture.

2025年2月15日 · The result confirms the presence of two valence states of Sn species in the SFM@SnO x, which is consistent with the XRD results. The valence state changes of transition metals (Fe and Mo) in SFM directly determine their conductivity and electrochemical performance.

2025年3月21日 · This study details the hydrothermal synthesis and characterization of SnO 2 /nanocellulose (NC) nanocomposites, highlighting their potential for advanced applications. X-ray diffraction (XRD ...

2019年6月30日 · In the study, we focus on establishing the controllable stoichiometry of SnO x via atomic layer deposition (ALD) and subsequent treatment. The controllable synthesis of SnO 2 and SnO is investigated by multiple analyses involving the …

通过X射线衍射（XRD），场发射扫描电子显微镜（FE-SEM）对SnO 2纳米纤维，SnO 2纳米纤维/纳米片和SnO 2纳米片的微观结构，形态，化学组成，氧化态和表面积进行了比较研究。

The observed XRD pattern confirms the formation of pure SnO2 polycrystalline phase, corresponding to a tetragonal crystal system with P42/mnm space group, and is found to be ...

4 天之前 · Figure 2 a shows the XRD patterns of SnTe prepared using different raw Sn materials and atmosphere conditions. The diffraction peaks of all samples closely match the standard pattern of SnTe, with no evident diffraction peaks for SnO 2. This may due to the low content of oxide, which is below the detection limit of the XRD instrument.

2012年7月27日 · X-ray diffraction (XRD), field emission scanning electron microscopy, and transmission electron microscopy (TEM) were employed to characterize the as-prepared product, and optical property was studied by UV-visible diffuse reflectance spectroscopy (DRS).