2020年5月1日 · Line profile analysis of the X-ray diffraction (XRD) patterns, using the Alexander-Klug, Adam-Cox, Rietveld, and Scherrer methods, was systematically used to investigate the effects of the milling time, BPMRs, sintering temperature, sintering time and zirconia-to-yttria ratio.

2019年5月1日 · YSZ is stabilized into its cubic form by high yttria contents; however, monoclinic YSZ forms with low yttria contents. The monoclinic phase is stable only at low temperatures and undergoes a martensitic transformation to a tetragonal phase at ~1000 °C.

In the present investigation, 30SiO2−30B2O3−10Y2O3- (30-x)CaO-xZrO2 (x=2.5, 5,7.5, 10) system has been synthesized by melt-quench technique. The as quenched samples are characterized using X-ray...

These characterizations support and augment prior optical, SEM, and XRD findings that demonstrated remarkable durability for the YSZ/Ti2AlC MAX phase system in aggressive burner tests. View...

2023年3月15日 · High-quality (100)-oriented yttria-stabilized zirconia (YSZ) films with uniform thickness were epitaxially grown on silicon substrates by a two-step process of pulsed laser deposition (PLD) and radio-frequency magnetron sputtering (RFS).

通过大气等离子喷涂制备了氧化钇稳定氧化锆（YSZ）热障涂层，并对其热冲击性能进行了评估。 通过电子背散射衍射 (EBSD) 和 X 射线衍射 (XRD) 对残余应力进行定性和定量分析。 并利用图像分析和扫描电镜定量分析涂层中裂纹的长度、方向和比例。 建立了涂层的微观结构与其热冲击性能之间的关系。 结果表明，喷涂功率改变了涂层的微观结构。 微观结构和残余应力影响涂层的热冲击性能。 这可能是由于喷雾功率的增加，

Scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), atomic force microscopy (AFM) and X-ray diffraction (XRD) techniques were used to characterize the complex ceramic...

2015年7月1日 · Yttria-stabilized zirconia (YSZ) has been studied as a promising material for application as an electrolyte in solid oxide fuel cells. In this work, YSZ powders ( (x Y 2 O 3 − (1 − x)ZrO 2), x = 5, 8 and 10 mol%) were synthesized by three different methods: co-precipitation, sol–gel combustion and sol–gel.

2016年4月22日 · Phase analysis of the YSZ nano-clusters was done by an X-ray diffraction XRD (D8 ADVANCE, Bruker, Germany) using Cu kα radiation (λ = 0.15406 nm) produced at 40 kV and 40 mA. The analyzed range of the diffraction angle 2θ was between 20° and 90°, by step width of 0.03° and a time per step equal to 1 s.

2020年4月13日 · Samples of 8 mol% Y2O3-stabilized ZrO2 (8YSZ) doped with Fe were prepared and sintered at 1350°C in air or argon atmosphere. The sintered samples were characterized by SEM, XRD, and Raman spectroscop...