
FIG. 7. XPS spectrum (Si 2p, Zr 3d, O 1s binding energy) of ZrSi 2...
ZrSi 2 is considered as an attractive ATF-coating material as it has an excellent compatibility with the inner Zr substrates [5]. The material homogeneity makes ZrSi 2 a good option for the...
High char yield BPR modified with ZrSi - Springer
2022年11月27日 · In this study, model-free method was employed to study the kinetic models of BPR and ZrSi 2 /B 4 C-Ph composite. In addition, the thermal stability, chemical reaction and structure evolution during pyrolysis of ZrSi 2 /B 4 C-Ph composite were characterized by TGA, XRD, XPS, GC–MS and TG-MS.
Thermal oxidation and compressive failure behavior of ZrSi2–B4C ...
2023年8月1日 · The present work aims to investigate the thermal oxidation and compressive failure behavior of the ZrSi 2 –B 4 C modified quartz fiber/boron containing phenolic resin (QF/BPR) composite. According to TGA-DSC, FT-IR, XRD and XPS, the thermal stability and phase transformation of the ZrSi 2 –B 4 C modified QF/BPR composite were studied.
Evolution of multilayered scale structures during high …
2016年10月20日 · XPS spectrum (Si 2 p, Zr 3 d, O 1 s binding energy) of ZrSi 2 oxidized at 700, 1000, and 1200 °C after 5 h oxidation. Position of the peak maximum (eV) is specified and the arrows indicate the trend of binding energy shift with increasing temperature (from 700 °C to …
SiC/SiC-ZrSi - ScienceDirect
2021年10月1日 · The chemical composition and bonding nature of the SiC-ZrSi 2 outer coating after oxidation for 238 h were studied by XPS (Fig. 10). The XPS results were calibrated with the standard C1s peak at 284.8 eV [47].
Improved ablation resistance of carbon–phenolic composites …
2015年12月1日 · X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) analyses reveal that the increased residue yield is attributed to the reactions between ZrSi 2 particles and pyrolysis volatiles.
The surface morphology evolution of ZrSi 2 films under different ...
2019年11月8日 · The surface morphology evolution of ZrSi 2 films under different substrate temperature are characterized by scanning electron microscope (SEM), x-ray photoelectron spectroscopy (XPS) and the electron back-scattered diffraction (EBSD). The sheet resistance of ZrSi 2 films are detected by the four-point probe method.
非晶Zr-Si氧化键合重构阶段的化学调控及相选择,Materials
提出了一种基于氧化诱导键合重建(OBR)的机制来优化非晶Zr x Si 1−x (0.55 ≤ x ≤ 0.75)氧化过程中的相选择。 根据VASP模型,提出了自势垒效应来调节初始氧化阶段的OBR和Zr/Si分离。 抑制的Si内扩散导致非晶双层结构的形成。 在外部 Zr-Si-O 非晶层下方形成富硅 Zr-Si 层,在亚临界环境下协同阻碍氧渗透。 EELS和XPS证实,Zr-Si-O层中Zr-O和Si-O键的替代有助于增强水化学稳定性。 提出了一种基于氧化诱导键合重建(OBR)的机制来优化非晶Zr x Si 1−x(0.55 ≤ x …
ZrSi2-B4C改性酚醛树脂基复合材料的热氧化和压缩破坏行 …
In this study, TGA-DSC, FT-IR, XRD and XPS were employed to the thermal stability and phase transformation of the ZrSi C modified quartz fiber/boron containing phenolic resin (QF/BPR) composite.
XPS data showing the Si 2p (A), Zr 3d (B), and O 1s (C) core-level ...
A chemical analysis of the nanoparticles bioleached from zircon sand was performed by XPS, which is known to be a highly surface-sensitive technique (Figure 3).
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