赛默飞积极响应大规模设备更新，我们的XPS元素表是Thermo Scientific™Avantage™ 数据系统的一个重要特征拥有庞大的知识库能提供 XPS 分析和元素表征相关的信息。此处按元素周期表排列给出了知识基础库。了解更多信息请访问我们的官网或联系我们的客服。

XPS 光谱解读. In3d 区域具有明显的自旋轨道分裂峰 (Δ 金属 =7.6 eV)。 金属峰形不对称。 在铟金属的 3d 3/2 自旋轨道分裂峰的较高结合能一侧观察到能量损失特征峰。

In3d region has well-separated spin-orbit components (Δ metal =7.6eV).. Peaks have asymmetric peak shape for metal. Loss features are observed to higher binding energy side of 3d 3/2 spin-orbit component for In metal.; In3d peaks may also show asymmetry for indium oxide, if other compounds are present (e.g. hydroxide) or there are vacancies/defects in the oxide lattice.

Indium元素的电子配置和X射线光电子谱等详细信息，都是XPS元素参考表的一部分。赛默飞科技提供全面的元素分析解决方案，帮助您准确理解和应用Indium元素。了解更多信息，请访问我们的官方网站。

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the very topmost 50-60 atoms, 0.01 um, 5-10 nm of any surface. It belongs to the family of photoemission spectroscopies in which electron population spectra are obtained by irradiating a material with a beam of X-rays.

X射线光电子能谱技术（XPS）是电子材料与元器件显微分析中的一种先进分析技术，而且是和俄歇电子能谱技术（AES）常常配合使用的分析技术。由于它可以比俄歇电子能谱技术更准确地测量原子的内层电子束缚能及其化学位移，所以它不但为化学研究提供分子结构和原子价态方面的信 …

On the other hand, O 1s XPS peaks for the catalysts can be deconvoluted into three bands at 529.7, 531.3, and 532.5 eV (Fig. 2a), attributed to lattice oxygen, oxygen in the vicinity of the oxygen ...

2022年8月22日 · Atoms present in compound being tested by XPS are determined according to the equation: Here, binding energy is the energy of an electron attracted to a nucleus; photon energy is the energy of X-ray photons being used by the spectrometer, and the kinetic energy is the energy of the ejected electrons from the sample.

2023年7月4日 · X-ray photoelectron spectroscopy is a surface-sensitive analytical technique that involves bombarding a material’s surface with X-rays and measuring the kinetic energy of the released electrons.The surface sensitivity and capacity to reveal chemical state information from the elements in the sample are two significant properties of this approach that make it powerful as an analytical tool.

The XPS spectra shown in Fig. 2(a) depict the full range scanned from 0 to 1200 eV. Peaks such as C, O1s, Si, In3p, In3d, In4s, In4p , and In4d were detected. The zoomed-in XPS spectra for the O1s ...